@article {Feng:June 2006:1546-198X:165,
	author = "Feng, Lihong",
	author = "Koziol, Darius",
	author = "Rudnyi, Evgenii B.",
	author = "Korvink, Jan G.",
	title = "Parametric Model Reduction for Fast Simulation of Cyclic Voltammograms",
	journal = "Sensor Letters",
	volume = "4",
	year = "June 2006",
	abstract = "Model order reduction is a well-established technique for fast simulation of large-scale models based on ordinary differential equations, especially those in the field of integrated circuits and micro-electro-mechanical systems. In this paper, we propose the use of parametric model reduction for fast simulation of a cyclic voltammogram. Instead of being considered as a time varying system, the model for a cyclic voltammogram is treated as a system with a parameter (applied voltage) which is to be preserved during model reduction. Because voltage is preserved in the symbolic form during model reduction, we can simulate the cyclic voltammogram with a reduced system and therefore invest much less time and memory as compared with direct simulation based on the original large-scale model. We present our approach for a case study based on scanning electrochemical microscopy.",
	pages = "165-173(9)",
	url = "http://www.ingentaconnect.com/content/asp/senlet/2006/00000004/00000002/art00011"
	doi = "doi:10.1166/sl.2006.021"
}